Free Download Introduction to Spectroscopic Ellipsometry of Thin Film Materials
by Wee, Andrew T. S.;Yin, Xinmao;Tang, Chi Sin;
English | 2022 | ISBN: 3527349510 | 200 pages | True PDF EPUB | 28.23 MB
A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization